SWS2000-JDSU JDS SWS2000 8-Channels Swept Wavelength System-Equipland Inc.

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JDSU JDS SWS2000 8-Channels Swept Wavelength System (SWS2000)

Manufacturer

JDS Uniphase Other Products

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Mfg. Part#

SWS2000

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Used

List Price

$150,000.00

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JDSU JDS SWS2000 8-Channels Swept Wavelength System (SWS2000)

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Product Overview

This JDS Uniphase Swept Wavelength System (SWS) is a fast, accurate, and flexible test solution for characterizing the wavelength and polarization dependence of passive optical components.

The SWS consists of: a tunable laser source, a receiver chassis, a control module, 8 detector modules, a four state polarization controller, a source optics module, all necessary fiber patchcords, and a computer system (including capture card) that has been preloaded and tested.

This is a C band measurement system that can test devices such as: couplers, splitters, isolators, WDM, DWDM, attenuators, switches, fiber Bragg grating, waveguide devices, wavelockers, gain flatteners, and interleavers. The SWS directly measures insertion loss (IL) as a function of wavelength along with polarization dependent loss (PDL). The software for the system provides a comprehensive set of analysis tools that will provide automatic calculations such as: Loss at peak, Center wavelength, Loss at center wavelength, Crosstalk, and Flatness. These parameters are calculated relative to the measured peak, ITU grid or user defined grid, and include all appropriate measurements for PDL when the polarization controller is used. Also, the parameters can be expressed in wavelength or frequency.

This system has been bench tested and meets original specifications. Each channel had better than +/- 0.03 dB accuracy and repeatability. with miminum averaging those numbers where shown to approach < 0.01 dB. The system components were last calibrated in 2001. A copy of both the User manual (in PDF format) and the software will also be included.

Features:

Reduces production test cost
� 0.002nm absolute wavelength accuracy
Low ASE tunable laser
High speed scanning (up to 40nm/s) over 1420-1630nm range
Distributed architecture
Up to 128 detector channels for device characterization
Flexible easy-to-use software
Customized applications through dynamic link libraries (DLLs)
24/7 service and support
CE compliant

		Specifications

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