Features:

• Generate exceptional waveforms even with reflective or poor terminations
• Dedicate the analyzer's whole display for pattern editing
• Simulate long distance testing using burst-mode gating in re-circulating loop tests
• Quickly locate the optimum decision point in the eye waveform with auto-decision thresholds and phase alignment
• Identify individual errored bits in custom patterns using error location analysis (ELA)
• Display any bit in a custom pattern using the flexible pattern trigger
• Automatically predict conventionally unmeasurable low BER using Q-factor measurement and eye-contour analysis
• Generate real-life test patterns to stress your system-under-test
• Create a cost effective 12.5 Gb/s frequency agile jitter measuring system
• Convert electrical-to-optical and optical-to-electrical signals that are SONET/SDH compliant

  Options:

  • 0B1 Additional English Manual Set
  • 100 1 to 12.5 GHz Internal Modular Clock Source
  • 1CM Rackmount Kit
  • 1CP Rackmount & Handle Kit
  • 806 0.1 - 12.5 GHz External Synthesized Sweeper
  • ABJ Japanese Localization
  • RMKT Agilent Refurbished Product
  • UHF 12.5 Gb/s Error Performance Analyzer
  • UHG 12.5 Gb/s Pattern Generator
  • UHH 12.5 Gb/s Error Detector
  • UHJ Error Location Analysis